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近紅外/短波紅外相機(jī) NIRvana: 640LN CCD相機(jī)

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近紅外/短波紅外相機(jī) NIRvana: 640LN

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NIRvana: 640LN

The NIRvana: 640LN from Princeton Instruments is a scientific-grade, deep-cooled, large format InGaAs camera for low-light scientific SWIR imaging and spectroscopy applications. The camera uses a 640 x 512 InGaAs array with greater than 75% response between 1.3 μm and 1.55 μm. The detector is liquid nitrogen cooled to 83 K (-190° C) to minimize thermally generated noise and to improve signal-to-noise ratio for the most demanding SWIR applications. It offers 16-bit digitization and low read noise for outstanding dynamic range.



FEATURESBENEFITS
640 x 512 InGaAs arrayHigh resolution imaging in the SWIR region;Offers 4X more pixels over 320 x 256 sensor
20 mm x 20 mm pixels High spatial resolution
Response from 0.9 μm to 1.6 μm with 70% (typical) peak quantum efficiency between 1.3 μm to 1.6 μmExcellent SWIR sensitivity for demanding imaging applications, e.g. SWIR astronomy, semiconductor failure analysis
Liquid nitrogen (LN) cooling Delivers lowest dark noise and allows integration time of > 60 minutes
Integrated cold-shield   Special “cold-shield" limits the ambient thermal background
Electronic shutterProvides integration times from 100 μs to ~ 60 minutes
Two readout modes 

Standard readout mode

Non-destructive readout mode (NDR)

F-mount 

Standard lens interface compatible with numerous lenses

(spectrometer adapters available)

Fused silica window Fused silica window for high transmission in SWIR range
GigE interface Industry standard for fast data transfer over long distances, up to 50 m
Optional:LightField (for Windows 8/7, 64-bit) Or WinView/Spec (for Windows 8/7/XP, 32-bit)Flexible software packages for data acquisition, display and analysis; MATLAB and LabVIEW support. LightField offers intuitive, cutting edge user interface, IntelliCal and more.
SITK for LabVIEW Easy integration into complex experimental setup

PICAM (64-bit) / PVCAM (32-bit) 

software development kits (SDKs)

Compatible with Windows 8/7/XP, and Linux;

Universal programming interfaces for easy custom programming.


NIRvana: 640LN shown with lens, sold separately.

NOTE: Export of this camera outside of the United States is prohibited by law unless accompanied 

by a valid Export License as issued by the United States Department of Commerce.



Applications:Semiconductor Failure Analysis, SWIR Astronomy, Emission Microscopy, Biological Deep-Tissue Imaging.

NIRvana: 640LN
InGaAs image sensor    2D InGaAs focal plane array
Image format640 x 512 imaging pixels
Image area12.8 mm x 10.24 mm
Pixel size20 mm x 20 mm 
Pixel well400 ke- (typ)
System read noise 15 e- (typ)
Cooling temp. @ +20°C ambient 83 K (-190°C) (typ)
Cooling method / Hold time Liquid nitrogen / >30 hours
Dark current (e-/p/sec) @ 83K (-190°C) 10 (typ)*
Blemish specification 

Grade A: < 2% defects

For detailed blemish specifications, contact Princeton Instruments

Gain 7 e- / ADU
Digitization 16 bits 
Scan rate 250 KHz, 125 KHz
Binning and ROI Software only
Cold shield f#/2
Max. exposure time > 60 min
Window material Fused silica 
Thermostating precision ±1.0° C across entire temperature range
Operating temperature 0° C to +30° C
Certification CE

Weight

Dimensions

15.43 lbs (7.0 kg) empty, 19.40 lbs (8.8 kg) full

11.65“ (295.30 mm) x 8.20“ (206.50 mm) x 11.70“ (297.20 mm) (l x w x h)

* Measured with a cold target at 99 K (-174° C)  


Frame Rates

Binning  @ 250 kHz@125 kHz 
1 x 1 2.77 fps1.75 fps 

NOTE: (1) Frame rates measured with 1 ms exposure(2) Hardware binning is not available



Comparison of 640 x 512, 20 μm pixel NIRvana-LN, NIRvana and NIRvana-ST 

Model 

NIRvana-LN NIRvana NIRvana-ST 

Array Resolution640 x 512 
Image Area12.8 mm x 10.24 mm 
Pixel Pitch20 μm x 20 μm 
Pixel Well 400 ke- ≥ 40 ke- (HG), ≥ 600 ke- (H cap) 
Peak Response range (> 75%) 1300 nm - 1550 nm900 nm - 1620 nm
Lens MountF-mount / IsoPlane 320  C-mount / Spec mount 
System Noise 15 e≤ 120 e- (HG) 
Readout ModesStandardStandard

NDR NA
Cooling Method 

LN (2.3 liters) 

TE 
Cooling Temp (°C)-190-85 -65

Dark Current (e-/p/s) 

10 (typ)≤ 300 

≤ 1500 

Gain

7 e- / ADU

Frame Rates (fps) 2.77 / 1.75110 (@ 10 MHz), 55 (@ 5 MHz), 22 fps (@2 MHz)

Scan Rate

250 KHz , 125 KHz

10 MHz, 5 MHz, 2 MHz

Cold Shield

f#/2

f#/1.5

Window Material

Fused Silica

Max. exposure time

> 60 min

> 60 min

> 30 sec

Weight 

7.0 kg (empty) / 8.8 kg (full)

9.5 lbs (4.3 kg) 

Size

11.63" x 8.13" x 11.70" (l x w x h)

7.40" x 5.8" x 5.8" (l x w x h) 

(295.30 mm x 206.50 mm x 297.20 mm)

(187.96 mm x 147.32 mm x 147.32 mm)


Typical Applications

Semiconductor Failure Analysis

Semiconductor Failure Analysis


Astronomy

Small Animal Imaging



Carbon Nanotube Research / Fluorescence



Astronomy



Singlet Oxygen Detection



















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