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RaySphere太陽光模擬器輻照度測量儀

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  • 公司名稱廣州標(biāo)旗光電科技發(fā)展股份有限公司
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  • 更新時間2021/8/4 16:28:30
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廣州標(biāo)旗光電科技發(fā)展股份有限公司成立于2005年,位于國家*產(chǎn)業(yè)開發(fā)區(qū)廣州科學(xué)城。在光譜快速檢測領(lǐng)域深耕10年,熟悉各種光譜快速檢測方案的搭建,為化工、光電、材料、農(nóng)學(xué)、生物等不同領(lǐng)域的客戶提供了上百種檢測方案,2014年被認(rèn)定為*。公司擁有強(qiáng)大的研發(fā)、銷售團(tuán)隊(duì),擁有*的創(chuàng)新能力,2015年榮獲廣州開發(fā)區(qū)“瞪羚企業(yè)”稱號,2016年成功認(rèn)定為廣州市研發(fā)機(jī)構(gòu),2016年順利通過ISO 9001:2015質(zhì)量管理體系認(rèn)證。
標(biāo)旗在“科技創(chuàng)新,真誠服務(wù)”的企業(yè)核心價(jià)值觀的下,不斷創(chuàng)新和發(fā)展,形成集算法開發(fā)、軟件開發(fā)、硬件開發(fā)、光路設(shè)計(jì)及電路設(shè)計(jì)為一體的研發(fā)體系,標(biāo)旗團(tuán)隊(duì)基于光纖光譜儀的應(yīng)用,開發(fā)了不同應(yīng)用領(lǐng)域的光譜快速檢測儀器,不斷沉淀與打造自主品牌——科思凱(Qspec)。目前,標(biāo)旗已擁有一系列具有核心競爭力的科思凱產(chǎn)品,包括:平面光學(xué)元件光譜分析儀、球面光學(xué)元件顯微檢測儀、透過率檢測儀、珠寶檢測儀、近紅外光譜檢測儀、全光譜層析掃描儀、非接觸光學(xué)測厚儀、微量紫外分光光度計(jì)、物質(zhì)分析儀和高功率鹵素冷光源等。標(biāo)旗科思凱系列產(chǎn)品儀器優(yōu)勢顯著,具有高效、迅速、準(zhǔn)確的特點(diǎn),將“中國創(chuàng)造”的研發(fā)理念與攻關(guān)思路融入到每項(xiàng)產(chǎn)品的開發(fā)中,實(shí)現(xiàn)產(chǎn)品應(yīng)用與科技進(jìn)步、市場需求緊密結(jié)合,不斷突破傳統(tǒng)技術(shù),實(shí)現(xiàn)產(chǎn)業(yè)升級改造,實(shí)現(xiàn)理論研究與生產(chǎn)應(yīng)用的轉(zhuǎn)化,真正將創(chuàng)造力作為公司不斷向前發(fā)展的核心動力,將中國創(chuàng)造內(nèi)化于企業(yè)發(fā)展中。

同時,標(biāo)旗也是許多科技裝備企業(yè)在國內(nèi)的*的代理商和經(jīng)銷商,包括:Ocean Optics光纖光譜儀(華南區(qū)總代理),PerkinElmer分析儀器、P&P成像光譜儀。

標(biāo)旗秉承專業(yè)、真誠、貼心的服務(wù)宗旨,針對客戶的需求,量身定制光譜檢測應(yīng)用方案,幫助客戶解決科研和生產(chǎn)中的實(shí)際問題,全程提供售前、售中和售后服務(wù)。標(biāo)旗的成長離不開客戶的支持,目前,公司積累了豐富的技術(shù)和客戶資源,積極與高校合作,致力于產(chǎn)學(xué)研的成長模式;而且努力為同行業(yè)者搭建線上和線下交流平臺,向客戶學(xué)習(xí),更好的服務(wù)于客戶。

科技的發(fā)展日新月異,標(biāo)旗緊跟科技進(jìn)步與時代發(fā)展的步伐,在光譜快速檢測道路上不斷前行,臻于至善。

光纖光譜儀,拉曼光譜儀,近紅外光譜儀,反射率測試儀
RaySphere太陽光模擬器輻照度測量儀
RaySphere太陽光模擬器輻照度測量儀 產(chǎn)品信息

RaySphere太陽光模擬器輻照度測量儀

Meet the new optical measurement system for absolute irradiance measurements of solar simulators and other radiant sources. The new RaySphere from Ocean Optics measures absolute irradiance over spectral ranges from the UV to the NIR (350 to 1700 nm).

This portable system is ideal for solar simulator manufacturers and research and development labs as a tool to validate the output of installed solar flashlamps. The flash of a solar simulator is used within the photovoltaic (PV) manufacturing process for the binning of cells according to spectral response and for final PV module efficiency measurements.

The RaySphere 太陽光模擬器輻照度測量儀 delivers the accuracy and resolution needed to measure and analyze the performance and stability of the flasher with ultralow jitter triggering electronics for timing the measurement to the flashes. Calibration has been validated by an accredited certification lab to ensure accurate detection, enabling evaluation and qualification of the spectral distribution of solar flashers and simulators according to the IEC60904-9 (2007) standard.

The system includes two thermoelectrically cooled detectors that perform repeatable and accurate spectral analysis of solar flashers from 350 to 1700 nm, and a second version contains a single cooled detector for measurement to 1100 nm.

RaySphere includes high-speed electronics and an intuitive powerful software interface. Brief measurement times enable detection of a complete spectrum during a flash or even during a portion of the flash. The measurement can be triggered by a fast response photodiode that reacts on the increasing intensity of the flashlight with sub-microsecond response times.

Trigger Mode

太陽光模擬器輻照度測量儀Features

  • Intuitive graphical interface
  • Graphical and table display of classification results by wavelength bin
  • Output of actual spectra in mW/cm^2/nm
  • Output of actual measurement and triggering timing with +/- 41 µs resolution
  • Printable classification report

Under the Hood

 RaySphereRaySphere 1700
Spectral range:350-1100 nm300-1700 nm
Spectral resolution:

1.9 nm (FWHM) for 300 - 1100 nm
12.5 nm (FWHM) for 1100-1700 nm

Optical input:

50 mm integrating sphere

Detector types:TEC stabilized Hamamatsu CCD sensorTEC stabilized Hamamatsu InGaAs sensor
Dynamic range:

25000:1 (Back-thinned Si)
15000:1 (InGaAs)

Corrected linearity:

>99.8%

Minimum integration time:

8 ms

Calibration:

Calibrated for irradiance measurements using national traceable standards (NIST, PTB, CNIM)

Calibration Accuracy:

Validated by accredited certification institute, typical values better than 2% accuracy in 400-1100 nm range

Triggering options:

Built-in photo trigger, external trigger, manual trigger

Operating environment:

Ambient Temperatures 10-35 ºC

Software:

Custom Analysis Software for Windows XP, Vista and 7 (32 and 64 bit)

Communications:

USB 2.0 high-speed

Photo-Trigger Specifications

Jitter (Realtime):<100 ns
Jitter (Software displayed):164 µs
Minimum measurement time:~9 ms
Programmable trigger delay:1040 µs - 168 ms
Trigger delay increment:2.56 µs
Time resolution of display:+/- 41 µs

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