2606B 系統(tǒng)源表源測量單元(SMU) 儀器在一個外形1U 高的機箱中集成了四個20W SMU 通道。2606B 基于 吉時利第三代SMU 技術，在一臺緊密集成的儀器中， 同時融合了精密電源、真實電流源、6 位半DMM、任 意波形發(fā)生器和脈沖發(fā)生器的功能。其提供了強大的 解決方案，明顯提升了測試效率，可以滿足苛刻的光 電器件自動檢定和生產測試需求，比如3D 傳感和光通 信中使用的VCSEL/ 激光二極管、消費品和汽車中使用 的LED 以及模擬IC、ASIC 和片上系統(tǒng)(SOC) 器件等 集成器件。在要求高SMU 通道數時，多臺2606B 儀 器可以相互堆疊，在儀器之間不需要散熱空間。基于 網絡瀏覽器的內置軟件可以通過任何電腦，從世界上 任何地方與2606B 通信。對自動系統(tǒng)應用，2606B 的 測試腳本處理器(TSP®) 技術從儀器內部運行整個測試 程序，實現(xiàn)業(yè)內吞吐量。在大型多通道應用中， 吉時利的TSP-Link® 技術與TSP 技術相結合，實現(xiàn)了 高速SMU-per-pin 并行測試。在使用于新應用時， 每臺2606B SMU 的代碼都能兼容行業(yè)的Keithley 2602B 系統(tǒng)源表SMU 儀器。
主要特點:
在一個 1U全機架機箱中實現(xiàn) 4 通道 SMU 儀器
可堆疊，儀器之間沒有 1U間隔要求
緊密集成的電壓/電流源和測量儀器，6位半分辨率，提供同類的性能
20 V @ 1 A 和 6 V @ 3 A 功率包絡，20 W
0.015% DCV基本準確度
高達 28個開路漏極數字 I/O 口
測試結果與 2602B系統(tǒng)源表 SMU 儀器一致
TSP 技術把整個測試程序嵌入儀器內部，實現(xiàn)了同類的系統(tǒng)級吞吐量
TSP-Link擴展技術，實現(xiàn)多通道并行測試，無需主機
前面板LAN (LXI-C)、USB 2.0 TMC488協(xié)議和數字I/O 接口
基于網絡瀏覽器的內置軟件，通過任何瀏覽器，從世界上任何地方任何電腦實現(xiàn)遠程控制
The 2606B system source-meter source-measurement unit (SMU) instrument is integrated with four 20W SMU channels in a 1u-high chassis. The 2606B is based on the GST third-generation SMU technology and is integrated in a tightly integrated instrument with the functions of precision power supply, real current source, 6-bit half-dmm, arbitrary waveform generator and pulse generator. It provides powerful solutions that significantly improve test efficiency and meet demanding requirements for automatic verification and production testing of optoelectronic components, such as VCSEL/ laser diodes for 3D sensing and optical communications, leds for consumer products and autos, and integrated devices such as analog IC, ASIC, and on-chip systems (SOC) devices. When the number of SMU channels is high, multiple 2606B meters can be stacked on top of each other and no heat dissipation space is required between the instruments. The built-in software based on the web browser can communicate with 2606B from any computer in the world. Application of automatic system, the 2606 b test scripts processor (TSP ®) run the entire test program from inside the instrument technology, the best throughput to achieve the industry. In large multi-channel application, keithley TSP ® cc-link technology combined with the TSP technology, realized the high-speed SMU - per - pin parallel test. Each 2606B SMU code is compatible with industry-leading Keithley 2602B system source list SMU instruments for use in new applications.
Main features:
Implement 4 channel SMU instrumentation in a 1U full rack chassis
Stackable, no 1U interval between instruments required
Tightly integrated voltage/current source and measuring instrument, 6 bit half resolution, providing best performance of its kind
20v@1a and 6v@3a power envelope, 20w
0.015% DCV basic accuracy
Up to 28 open drain digital I/O ports
The test results are consistent with the SMU instrument of the system source meter 2602B
TSP technology embedded the whole test program into the instrument to achieve the best system level throughput of the same kind
TSP-Link extension technology, multi - channel parallel testing, no host
Front panel LAN (lxi-c), USB 2.0 TMC488 protocol and digital I/O interface
Web browser-based built-in software that enables remote control from any computer anywhere in the world via any browser
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